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Electron Microprobe Analysis
- Instructor
- Dr. Nilanjan Chatterjee
- Term
- January IAP 2012
- Level
- Undergraduate
- What's inside
- 1 lecture note · 1 reading · 10 other files · 4 web pages
- Materials open
- MIT OCW
About this course
Source: MIT OpenCourseWare 12.141 Electron Microprobe Analysis, January IAP 2012, Dr. Nilanjan Chatterjee — original course page on ocw.mit.edu ↗. License: CC BY-NC-SA 4.0. Study order: MIT's own listing order, section by section. Taken from MIT's published course files, downloaded from ocw.mit.edu on September 23, 2026. How RedLectern is built.
Materials are grouped the way MIT organized them. A verified, course-wide order has not been established here.
Has MIT solutions
Before you start
Prerequisites are not listed here. Check MIT's own syllabus for this course.
How this course was organized
What's here, and what isn't
- A lecture sequence of 4 items is confirmed. Assignment and exam materials exist too, but MIT's own order for them could not be verified, so they're shown as materials below rather than a sequence.
Not included here
1 item from the source could not be safely included:
- Referenced in a table, but without MIT's own verified order, so it isn't used to claim a sequence.
Materials by section
Grouped by section, as MIT organized them. Not sequenced or ordered.
Readings
Lecture Notes
- Lecture 1 · Introduction; electron-specimen interactions; electron detectors; scanning electron… · Lecture slides Download
- Lecture 2 · X-ray generation, emission, detection and measurement; wavelength dispersive spectrometer… · Lecture slides Download
- Lecture 3 · Quantitative analysis using WDS; sample preparation; carbon coating; peak and background… · Lecture slides Download
- Lecture 4 · Matrix (ZAF) corrections in quantitative analysis; φ(ρz) corrections · Lecture slides Download
Assignments
Course outline
Calendar · Lecture Notes
Lecture 2: X-ray generation, emission, detection and measurement; wavelength dispersive spectrometer (WDS); analyzing crystals and proportional counters; WDS signal processing with single channel analyzer; compositional imaging (X-ray mapping) using WDS.
Calendar · Lecture Notes
Lecture 3: Quantitative analysis using WDS; sample preparation; carbon coating; peak and background in WD spectra; detector settings through pulse height analysis; peak overlap corrections.
Calendar · Lecture Notes
Lecture 4: Matrix (ZAF) corrections in quantitative analysis; φ(ρz) corrections.
MIT OpenCourseWare, Dr. Nilanjan Chatterjee, 12.141 Electron Microprobe Analysis, January IAP 2012.
License: CC BY-NC-SA 4.0 · Edition: January IAP 2012 · Open the original course on OCW ↗
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